DELGADO, G. E.; MORA, A. . J.; PINEDA, C.; AVILA-GODOY, R.; PAREDES-DUGARTE, S. X-RAY POWDER DIFFRACTION DATA AND RIETVELD REFINEMENT OF THE TERNARY SEMICONDUCTOR CHALCOGENIDES AgInSe2 AND AgInTe2. Revista Latinoamericana de Metalurgia y Materiales, [S. l.], p. 110–117, 2014. Disponível em: https://www.rlmm.org/ojs/index.php/rlmm/article/view/546. Acesso em: 25 nov. 2025.