GRIMA GALLARDO, P.; MUÑOZ, M.; DURAN, S.; DELGADO, G.; PÉREZ-CAPPÉ, E.; AITKEN, J.; RAY, D. P. (CuAlSe2)1-X(TaSe)XALLOY SYSTEM (0 ≤ X≤ 0.5): X-RAY DIFFRACTION, DIFFERENTIAL THERMALANALYSIS AND SCANNING ELECTRON MICROSCOPY MEASUREMENTS. LatinAmerican Journal of Metallurgy and Materials, [S. l.], p. 34–49, 2021. DOI: 10.5281/zenodo.7397075. Disponível em: https://www.rlmm.org/ojs/index.php/rlmm/article/view/1071. Acesso em: 14 nov. 2026.