X-RAY DIFFRACTION PEAK ANALYSIS OF TWO METALLIC MATERIALS

Authors

  • Claudio Aguilar Departamento de Ingeniería Metalúrgica y Materiales
  • Danny Guzman Departamento de Metalurgia, Facultad de Ingeniería, Universidad de Atacama, Av. Copayapu 485, Copiapó, Chile
  • Carlos Iglesias Departamento de Ingeniería Metalúrgica, Facultad de Ingeniería, Universidad de Santiago de Chile, Av. L. Bernardo O´Higgins 3363, Santiago, Chile

Abstract

The present work it is make a to review of the simplified methods of the X-ray diffraction peak profile analysis of as a powerful tool for the characterization of the structure of polycrystaline materials and to show an example of use of that methods. The considered methods are those of the traditional and modified Williamson-Hall and Warren-Averbach methods. The use of these methods for obtains stacking fault probability, dislocation contrast factors and crystallite size distribution is shown. The methods are applied to a Cu-5 wt.% Cr processed by means mechanical alloying and to a manganese steel obtained by means conventional melting and cold deformed in compression.

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Published

2011-11-28

How to Cite

Aguilar, C., Guzman, D., & Iglesias, C. (2011). X-RAY DIFFRACTION PEAK ANALYSIS OF TWO METALLIC MATERIALS. LatinAmerican Journal of Metallurgy and Materials, 15–32. Retrieved from https://www.rlmm.org/ojs/index.php/rlmm/article/view/266

Issue

2013, 33(1)

Section

Regular Articles

License

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